X-ray Fluorescence (XRF) Spectrometer

14_X-ray Fluorescence (XRF) Spectrometer.png (132 KB)

The XDAL 237 SDD XRF Spectrometry is a nondestructive, fast, simple, and accurate way of material composition analysis. Its most notable qualities include no, or minimal, sample preparation, non-destructive analysis, and compatibility with solid, liquid, and powdered samples.

Typical Applications:

  • Coating thickness and thin film measurements
  • RoHS screening for electronics compliance
  • Alloy analysis/ positive material identification (PMI)
  • Metal testing
  • Defect analysis
  • Contaminant identification
  • Solder voids
  • Element imaging of PCBs
  • Ion migration


  • Adjustable XRAY tube High voltage: 10KV; 30KV; 50KV
  • Programmable, motor-drive XY stage
  • A video camera in sync with the emitter allows continuous monitoring of the position on the sample, making it possible to locate an area of interest prior to analysis
  • Material analysis mode of the XRF provides analytical range from Aluminum (Z=13) to Uranium (Z=92) where detection from 0.1% to 100% is achieved accurately
  • The minimum collimator size of 100µm allows XRF analysis of small regions of interest
  • Thickness measurement mode provides the ability to determine depth of known layers of material
  • Fundamental Parameters (FP) calibration mode to measure 1~4 layers which require no or few standards
  • “Empirical” Region of Interest (ROI) calibration for highest accuracy when a full set of standards is available
  • Maximum travel: X/Y axis: 255 x 235mm; Z-axis: 140mm
  • Usable sample placement area: W 300 x D 350mm
  • Maximum sample weight: 5kg
  • Maximum sample height: 140mm
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