X-ray Fluorescence (XRF) Spectrometer

The XDAL 237 SDD XRF Spectrometry is a nondestructive, fast, simple, and accurate way of material composition analysis. Its most notable qualities include no, or minimal, sample preparation, non-destructive analysis, and compatibility with solid, liquid, and powdered samples.

Typical Applications:

• Coating thickness and thin film measurements
• RoHS screening for electronics compliance
• Alloy analysis/ positive material identification (PMI)
• Metal testing
• Defect analysis
• Contaminant identification
• Solder voids
• Element imaging of PCBs
• Ion migration

Specifications:

• Adjustable XRAY tube High voltage: 10KV; 30KV; 50KV
• Programmable, motor-drive XY stage
• A video camera in sync with the emitter allows continuous monitoring of the position on the sample, making it possible to locate an area of interest prior to analysis
• Material analysis mode of the XRF provides analytical range from Aluminum (Z=13) to Uranium (Z=92) where detection from 0.1% to 100% is achieved accurately
• The minimum collimator size of 100µm allows XRF analysis of small regions of interest
• Thickness measurement mode provides the ability to determine depth of known layers of material
• Fundamental Parameters (FP) calibration mode to measure 1~4 layers which require no or few standards
• “Empirical” Region of Interest (ROI) calibration for highest accuracy when a full set of standards is available
• Maximum travel: X/Y axis: 255 x 235mm; Z-axis: 140mm
• Usable sample placement area: W 300 x D 350mm
• Maximum sample weight: 5kg
• Maximum sample height: 140mm